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Application of the HLSVD Technique to the Filtering of X-Ray Diffraction Data

EURASIP Journal on Advances in Signal Processing volume 2007, Article number: 039575 (2007) Cite this article

Abstract

A filter based on the Hankel-Lanczos singular value decomposition (HLSVD) technique is presented and applied for the first time to X-ray diffraction (XRD) data. Synthetic and real powder XRD intensity profiles of nanocrystals are used to study the filter performances with different noise levels. Results show the robustness of the HLSVD filter and its capability to extract easily and effciently the useful crystallographic information. These characteristics make the filter an interesting and user-friendly tool for processing of XRD data.

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Authors and Affiliations

  1. Istituto di Cristallografia (IC), Consiglio Nazionale delle Ricerche (CNR), Via Amendola 122/O, Bari, 70126, Italy

    M. Ladisa

  2. Istituto Applicazioni del Calcolo Mauro Picone (IAC), Consiglio Nazionale delle Ricerche (CNR), Via Amendola 122/D, Bari, 70126, Italy

    A. Lamura & G. Nico

  3. SISTA, SCD Division, Department of Electrical Engineering (ESAT), Katholieke Universiteit Leuven, Kasteelpark Arenberg 10, Leuven-Heverlee, 3001, Belgium

    T. Laudadio

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  1. M. Ladisa
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  2. A. Lamura
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  3. T. Laudadio
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  4. G. Nico
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Correspondence to M. Ladisa.

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Open Access This article is distributed under the terms of the Creative Commons Attribution 2.0 International License (https://doi.org/creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Ladisa, M., Lamura, A., Laudadio, T. et al. Application of the HLSVD Technique to the Filtering of X-Ray Diffraction Data. EURASIP J. Adv. Signal Process. 2007, 039575 (2007). https://doi.org/10.1155/2007/39575

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  • DOI: https://doi.org/10.1155/2007/39575

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