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  • Research Article
  • Open Access

Pattern Projection with a Sinusoidal Phase Grating

EURASIP Journal on Advances in Signal Processing20082009:351626

  • Received: 1 October 2007
  • Accepted: 21 March 2008
  • Published:


The aim of this work is to study the diffractive properties of a sinusoidal phase grating for incorporation as a pattern projection element in a multisource and multicamera phase-shifting profilometric system. Two challenges should be overcome for successful operation of such a system, which are connected to inherent limitations of the phase-shifting algorithm—requirements for a sinusoidal fringe profile and for equal background and contrast of fringes in the recorded patterns. As a first task, we analyze the frequency content of the projected fringes in the Fresnel diffraction zone for parallel and divergent light illumination at different grating parameters and wavelengths. As a second task, we evaluate the systematical errors due to higher harmonics and multiwavelength illumination. Finally, operation of the four-wavelength profilometric system is simulated, and the error of the profilometric measurement evaluated. The results of test measurements are also presented.


  • High Harmonic
  • Light Illumination
  • Publisher Note
  • Pattern Projection
  • Fresnel Diffraction

Publisher note

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Authors’ Affiliations

Central Laboratory of Optical Storage and Processing of Information, Bulgarian Academy of Sciences, P.O. Box 95, 1113, Sofia, Bulgaria


© Elena Stoykova et al. 2009

This article is published under license to BioMed Central Ltd. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.