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Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement

EURASIP Journal on Advances in Signal Processing volume 2005, Article number: 731636 (2005) Cite this article

Abstract

In white-light interference microscopy, measurement of surface shape generally requires peak extraction of the fringe function envelope. In this paper the Teager-Kaiser energy and higher-order energy operators are proposed for efficient extraction of the fringe envelope. These energy operators are compared in terms of precision, robustness to noise, and subsampling. Flexible energy operators, depending on order and lag parameters, can be obtained. Results show that smoothing and interpolation of envelope approximation using spline model performs better than Gaussian-based approach.

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Authors and Affiliations

  1. Université Louis Pasteur Laboratoire Phase, CNRS/STIC-UPR 292, 23 rue du Loess, BP 20, Strasbourg Cedex 2, 67037, France

    Fabien Salzenstein, Paul C. Montgomery & Denis Montaner

  2. IRENav, École Navale, Lanvéoc Poulmic, BP 600, 29240, Brest-Armées, France

    Abdel-Ouahab Boudraa

Authors
  1. Fabien Salzenstein
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  2. Paul C. Montgomery
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  3. Denis Montaner
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  4. Abdel-Ouahab Boudraa
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Correspondence to Fabien Salzenstein.

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Open Access This article is distributed under the terms of the Creative Commons Attribution 2.0 International License ( https://creativecommons.org/licenses/by/2.0 ), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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Salzenstein, F., Montgomery, P.C., Montaner, D. et al. Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement. EURASIP J. Adv. Signal Process. 2005, 731636 (2005). https://doi.org/10.1155/ASP.2005.2804

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  • DOI: https://doi.org/10.1155/ASP.2005.2804

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