Open Access

Teager-Kaiser Energy and Higher-Order Operators in White-Light Interference Microscopy for Surface Shape Measurement

  • Fabien Salzenstein1Email author,
  • Paul C. Montgomery1,
  • Denis Montaner1 and
  • Abdel-Ouahab Boudraa2
EURASIP Journal on Advances in Signal Processing20052005:731636

https://doi.org/10.1155/ASP.2005.2804

Received: 10 November 2004

Published: 23 October 2005

Abstract

In white-light interference microscopy, measurement of surface shape generally requires peak extraction of the fringe function envelope. In this paper the Teager-Kaiser energy and higher-order energy operators are proposed for efficient extraction of the fringe envelope. These energy operators are compared in terms of precision, robustness to noise, and subsampling. Flexible energy operators, depending on order and lag parameters, can be obtained. Results show that smoothing and interpolation of envelope approximation using spline model performs better than Gaussian-based approach.

Keywords and phrases

Teager-Kaiser energyhigher-order operatorswhite-light interferometrysubsampling

Authors’ Affiliations

(1)
Université Louis Pasteur Laboratoire Phase, CNRS/STIC-UPR 292, Strasbourg Cedex 2, France
(2)
IRENav, École Navale, Lanvéoc Poulmic, Brest-Armées, France

Copyright

© Salzenstein et al. 2005