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Table 3 Device parameters of STT-RAM

From: Improving reliability of non-volatile memory technologies through circuit level techniques and error control coding

 

Nominal

Variance

Transistor channel length(nm)

32

5%

Transistor channel width (nm)

96, 128, 160

5%

Transistor threshold (RDF)

0.4 V

σ VT =40 mV

Rp (P)

2.25K

Approximately 6%

RAP (AP)

4.5K

Approximately 6%

MTJ initial angle

0

0.1π