From: Covariance tracking: architecture optimizations for embedded systems
Notation | Meaning |
---|---|
I | Input image |
h and w | Height and width of I |
n F | Number of features used to build the descriptor |
n P | Number of crossed-products of features n P = n F (n F + 1)/2 |
F | A data structure that contains all the features images |
P | A data structure containing all the feature image products |
I F and I P | The summed area tables (integral images) computed from F or P |
card | The cardinal of SIMD register: 4 for SSE and Neon, 8 for AVX |
v n F | Number SIMD registers to hold n F features: v n F = ⌈n F /card⌉ |
v n P | Number SIMD registers to hold n P products: v n P = ⌈n P /ccard⌉ (see Table 3) |